|Grazing Incidence Diffraction|
Grazing Incidence Diffraction (GIXRD):
We now have the capability to obtain diffraction patterns from very thin, very flat nano-crystalline surfaces using Co or Cu radiation. This can be used on samples tens of nanometers thick, and can identify multiple layers of different phases. The technique makes use of the quarter-? circle on the D8-Davinci diffractometer with a motorized stage, telescope + laser sample +diffraction sample alignment, a parallel line source, and either a point detector or a knife edge and the Vantec500 area detector. It is suitable for analysis of coatings on sheet metal or nano-layer electronic films on substrates.
Bruker D8 Davinci, point or area detector, knife edge, focussed Co/Cu